Clock forming method for semiconductor integrated circuit and program product for the method

ABSTRACT

Regions G 1  to G 8  each including a predetermined number of flip-flops (FF) are divided into two groups. This dividing is performed so that the number of data connection channels intersected by a boundary is minimized. In the case of intersection of two data connection channels (A 1 , A 2 ), the number of data connection channels intersected by the boundary is two, the minimum number. After grouping of all the regions (G 1  to G 4,  G 5  to G 8 ), clock tree synthesis (CTS) is performed. If clock forming is performed in this way, the increase in clock skew on an actual device can be limited and on-chip variation resistance can be increased.

BACKGROUND OF THE INVENTION

1. Field of the Invention

The present invention relates to a clock forming method for asemiconductor integrated circuit and a program product for the method,and more particularly, to the method and the program product for theimproved on-chip-variation resistance.

2. Background Art

It is difficult to supply a clock accurately and correctly to allsequential elements of a large scale semiconductor integrated circuit(LSI). In ordinary cases, a clock is supplied to different portions atdifferent times. The difference between times at which a clock issupplied is called a clock skew. With the increase in packaging densityand the increase in degree of integration of LSIs, a need has arisen toreduce clock skews of a clock applied to different portions. Clock skewsare produced mainly at the design stage. Therefore, clock skew controlwith high accuracy is required when a clock is formed.

In Japanese Unexamined Patent Publication No. 8-129576, a layout methoddescribed below. First, the size, shape and other properties of blocksand inter-block wiring channels are accurately estimated and a blockarrangement is determined. Arrangement and wiring in each block arethereafter performed to reduce the clock skew from an external clockterminal to a clock terminal in the block. Further, wiring layout isperformed so that the clock skew from a clock generation source to theexternal clock terminal is within a predetermined range.

FIG. 5 is a diagram showing an example of synthesis of a clock tree by aconventional clock forming method. Four flip-flops (FF) are placed ineach of regions G1 to G8 in a circuit region 1. The regions G1 to G4 andthe regions G5 to G8 are separated from each other by a boundary 2.Further, the regions G1 and G2 and the regions G3 and G4 are separatedby a boundary 3 a and the regions G5 and G6 and the regions G7 and G8are separated by a boundary 3 b.

A clock driver 4 is provided in each of the regions G1 to G8 and isconnected to the FFs in the area. An upper-order clock driver 5 isprovided between each of the adjacent pairs of the regions G1 and G2, G3and G4, G5 and G6, and G7 and G8 to connect the clock drivers 4 in theadjacent pair of the regions. At each of the boundaries 3 a and 3 b, afurther upper-order clock driver 6 is provided to connect the clockdrivers 5. There are also provided data connection channels A1 to A4, B1to B3, and C1 to C3 for data transfer between the regions.

Clock buffers (not shown) are connected to the clock drivers. Delayadjustment is performed so that the values of delays of clock signals toclock terminals of the FFs seen from the clock buffers are equal to eachother. More specifically, arrangement and adjustment of clock buffersand insertion of a delay element to a faster path are performed. If atool for performing such operates in an ideal manner, the delays ofclock signals from a clock start point to all the FFs at terminal endscan be made equal to each other to reduce the clock skew to zero.

The above-described method is a clock forming method of reducing theclock skew to zero without considering on-chip variation. In actuality,however, on-chip variation exists. Therefore, if the data connectionchannels are not uniform, a difference occurs between an assumed delayvalue and the delay value on an actual device, so that the actual clockskew is not reduced to zero.

FIG. 6 shows the structure of a clock tree when data transfer isperformed between the regions G2 and G5 (via the data connection channelA1) shown in FIG. 5. In this case, the clock signal passes through theclock drivers 4, 5, and 6. It is assumed here that the delay value withrespect to one clock driver stage in a situation without considerationof on-chip variation is 1 ns, and that delay variation of ±10% due toon-chip variation occurs randomly. The delay value when on-chipvariation is not considered is 3 ns. If on-chip variation of ±10% isconsidered, the delay value with respect to the data connection channelA1 is in the range from 2.7 to 3.3 ns and a skew of 600 ps (0.6 ns) atthe maximum occurs.

FIG. 7 shows the structure of a clock tree when data transfer isperformed between the regions G1 and G3 (via the data connection channelB1) shown in FIG. 5. In this case, the clock signal passes through theclock drivers 4 and 5. If the same assumption as that in the above ismade, the delay value when on-chip variation is not considered is 2 ns.If on-chip variation of ±10% is considered, the delay value with respectto the data connection channel B1 is in the range from 1.8 to 2.2 ns anda skew of 400 ps (0.4 ns) at the maximum occurs. Similarly, when datatransfer is performed via one of the data connection channels C1 to C3shown in FIG. 5, the clock signal passes through the clock in one stage.Accordingly, the delay value of these data connection channels is in therange from 0.9 to 1.1 ns and a skew of 200 ps (0.2 ns) at the maximumoccurs.

Any division of the regions G1 to G8 shown in FIG. 5 is not effective inpreventing the occurrence of the above-described skew. Even in asituation where a large skew occurs when on-chip variation isconsidered, there is no problem in practice if data transfer is notperformed between the corresponding regions. Conversely, if datatransfer is performed between the regions between which a large skew canoccur due to on-chip variation, there is a need to take measures toprevent the occurrence of a hold error and a setup error by consideringon-chip variation.

In the above-described conventional clock forming method, a clock isformed without consideration of on-chip variation so that the clock skewis zero. There is, therefore, a problem that even if the clock skewreduced to zero, the clock skew increases on an actual device whenon-chip variation is considered.

SUMMARY OF THE INVENTION

The present invention has been developed to solve the above-describedproblems, and therefore it is an object of the present invention toprovide a provide a clock forming method which limits the increase inclock skew on an actual device and which ensures improvedon-chip-variation resistance, and a program product for the method.

The above object is achieved by a clock forming method for asemiconductor integrated circuit that includes a first step of dividinga predetermined number of times a circuit region including a pluralityof regions each having a predetermined number of elements and connectionchannels for transferring data between the plurality of regions, and asecond step of synthesizing a clock tree by inserting clock drivers sothat the elements in the regions divided in the first step are connectedin tree form, wherein the number of the connection channels intersectedby a boundary is minimized when the circuit region is divided.

The above object is achieved by a program product for causing a computerto execute a first step of dividing a predetermined number of times acircuit region including a plurality of regions each having apredetermined number of elements and connection channels fortransferring data between the plurality of regions, a second step ofsynthesizing a clock tree by inserting clock drivers so that theelements in the regions divided in the first step are connected in treeform, wherein the number of the connection channels intersected by aboundary is minimized when the circuit region is divided.

According to the present invention, a clock forming method which limitsthe increase in clock skew on an actual device and which ensuresimproved on-chip-variation resistance and a program product for themethod can be obtained.

Other features and advantages of the invention will be apparent from thefollowing description taken in connection with the accompanyingdrawings.

BRIEF DESCRIPTION OF DRAWINGS

FIG. 1 shows a clock forming method of the first embodiment;

FIGS. 2 and 3 show a clock tree synthesized by the method of the firstembodiment;

FIG. 4 shows a clock forming method of the second embodiment;

FIG. 5 shows a conventional clock forming method; and

FIGS. 6 and 7 show a clock tree synthesized by a conventional clockforming method.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

Embodiments of the present invention will be described below referringto the drawings. In the drawings, the same or equivalent parts will bedenoted by the same reference numerals, and the description thereof willbe simplified or omitted.

First Embodiment

A clock forming method for a semiconductor integrated circuit accordingto the first embodiment of the present invention will be described. Theclock forming method described below is a method of performing clocktree synthesis (hereinafter referred to as “CTS”) after dividing acircuit region (grouping).

A method of dividing a circuit region into groups of regions will firstbe described. As shown in FIG. 1, a multiplicity of flip-flops(hereinafter referred to “FF”) exit in a circuit region 1. As a standardmethod of dividing into groups regions, a method of grouping FFs intogroups of equal numbers of FFs or a method of dividing an area intoequal parts may be used. An example of grouping by dividing a regioninto equal parts for equal number of FFs will be described below.

As shown in FIG. 1, each of regions G1 to G8 contains four FFs.Connection channels for data transfer between certain regions(hereinafter referred to as “data connection channel”) exist between theregions G1 to G8. Data connection channels A1 and A2 exist between theregions G1 and G5 and between the regions G4 and G8, respectively. Dataconnection channels B1, B2, B3, and B4 exist between the regions G2 andG4, between the regions G5 and G7, between the regions G6 and G7 andbetween the regions G6 and G8, respectively. Further, data connectionchannels C1, C2, C3, and C4 exist between the regions G1 and G2, betweenthe regions G3 and G4, between the regions G5 and G6 and between theregions G7 and G8, respectively.

Grouping is performed to divide the regions G1 to G8 into a group ofregions G1 to G4 and a group of regions G5 to G8 by a boundary 2.Grouping is further performed to divide the regions G1 to G4 into agroup of regions G1 and G2 and a group of regions G3 and G4 by aboundary 3 a. Also, grouping is performed to divide the regions G5 to G8into a group of regions G5 and G6 and a group of regions G7 and G8 by aboundary 3 b. (These boundaries are not lines actually existing on thecircuit region 1 but virtual lines.)

When the above-described grouping is performed, a graph theory is usedto perform grouping so that the number of data connection channelsintersected by each boundary is minimized. If the regions G1 to G8 aredivided into two groups so that the boundary by which the regions aredivided intersects the data connection channels A1 and A2, the number ofdata connection channels intersected by the boundary is two, the minimumnumber. Thus, the regions G1 to G4 and the regions G5 to G8 are dividedinto two groups by the boundary 2. The above-described graph theory iswell-known and no further description will be made of it.

If the regions G1 to G4 are divided into two groups so that the boundaryby which the regions are divided intersects the data connection channelB1, the number of data connection channels intersected by the boundaryis one, the minimum number. Thus, the regions G1 and G2 and the regionsG3 and G4 are divided into two groups by the boundary 3 a. When theregions G5 to G8 are divided into two groups, the number of dataconnection channels intersected by the boundary is three irrespective ofin which way the regions are divided. In such a case, the regions aredivided so that the boundary 3 b intersects a data connection channel ofa longer channel length with priority. That is, the regions are dividedso that the boundary intersects a larger number of data connectionchannels having longer interconnection distances. In this example ofdividing, the interconnection distance between the regions G6 and G8 isthe largest among the data connection channels between the regions G5 toG8. Accordingly, intergroup wiring is provided between the regions G6and G8 such that the data connection channel B4 is intersected. Thus,the regions G5 and G6 and the regions G7 and G8 are divided into twogroups by the boundary 3 b.

In the above-described grouping of the regions G5 to G8 into two groups,a determination measure “to make the boundary intersect a larger numberof data connection channels having longer interconnection distances” isused. In place of such a determination measure, “to maximize the sum ofinterconnection distances intersected by a boundary”, “to minimize thenumber of wiring lines having interconnection distances equal to orsmaller than a predetermined value intersected by a boundary”, or “tomaximize the sum of the number of wiring lines having interconnectiondistances equal to or smaller than a predetermined value intersected bya boundary” may be adopted. Also, “having longer connection distances”in the above-described measure may be replaced with “having a largernumber of on-data-line logic stages (cells).

CTS is executed on the circuit region 1 divided into groups of regions.That is, clock drivers are inserted so as to connect the FFs in thecircuit region 1 in tree form, thereby synthesizing a clock tree. EachFF in each of the regions G1 to G8 is thereby connected to one clockdriver (which is not illustrated). For example, the four FFs existing inthe region G1 are connected to one clock driver. An upper-order clockdriver is inserted between the regions G1 and G2 to connect with theclock drivers in the two regions. Similarly, clock drivers are insertedbetween the regions G3 and G4, between the regions G5 and G6 and betweenthe regions G7 and G8 to connect with the clock drivers in the regions.Further, a clock driver is inserted on the boundary 3 a to connect withthe clock driver between the regions G1 and G2 and with the clock driverbetween the regions G3 and G4. Similarly, a clock driver is inserted onthe boundary 3 b to connect with the clock driver between the regions G5and G6 and with the clock driver between the regions G7 and G8. A clocktree is formed in this way.

FIG. 2 shows the structure of the clock tree synthesized between theregions G1 and G5 (through the data connection channel A1) shown in FIG.1 by the above-described clock tree synthesis. When data transfer isperformed via the data connection channel A1, a clock signal passesthrough clock drivers 4, 5 and 6 in three stages. If on-chip variationof 200 ps exists with respect to the clock driver in each stage, a clockskew of 600 ps at the maximum occurs in the data connection channel A1.A clock skew of 600 ps at the maximum also occurs between the regions G4and G8 (in the data connection channel A2) shown in FIG. 1.

FIG. 3 shows the structure of the clock tree synthesized between theregions G2 and G4 (through the data connection channel B1) shown inFIG. 1. When data transfer is performed via the data connection channelB1, the clock signal passes through the clock drivers 4 and 5 in twostages. If the same assumption as that in the above is made, a clockskew of 400 ps at the maximum occurs in the data connection channel B1.A clock skew of 400 ps at the maximum also occurs between the regions G5and G7 (in the data connection channel B2), between the regions G6 andG7 (in the data connection channel B3) and between the regions G6 and G8(in the data connection channel B4).

When data transfer (not shown) is performed between the regions G1 andG2 (via the data connection channel C1), between the regions G3 and G4(via the data connection channel C2), between the regions G5 and G6 (viathe data connection channel C3) and between the regions G7 and G8 (viathe data connection channel C4), the clock signal passes through theclock driver in one stage. If the same assumption as that in the aboveis made, a clock skew of 200 ps at the maximum occurs in the dataconnection channels.

That is, the data connection channels A1 and A2 are lower inon-chip-variation resistance than the other channels in the circuitregion 1. In this embodiment, the circuit region 1 is divided intogroups of regions so that the number of data connection channelsintersected by a boundary is minimized. In this way, data connectionchannels having lower on-chip-variation resistance can be reduced incomparison with the conventional art (see FIG. 5). More specifically,while the number of data connection channels in which a clock skew of600 ps at the maximum can occur is four, the number of correspondingdata connection channels can be reduced to two in this embodiment (seeFIG. 1). Thus, the increase in clock skew on an actual device can belimited and the on-chip-variation resistance can be increased.

Grouping of the regions G5 and G6 and the regions G7 and G8 is performedso that the boundary 3 b intersects the data connection channel B4. Inthis case, the data transfer delay through the data connection channelB4 is increased since the interconnection distance of the dataconnection channel B4 is larger than those of the data connectionchannels B2 and B3. Therefore, no hold error occurs even if a certainamount of clock skew is caused. As a result, measures against on-chipvariation can be minimized.

Second Embodiment

A clock forming method for a semiconductor integrated circuit accordingto the second embodiment of the present invention will be described. Thesecond embodiment will be described with respect to points of differencefrom the first embodiment. In the above-described grouping method in thefirst embodiment, grouping is performed so that the number of dataconnection channels intersected by a boundary is minimized. With respectto grouping by this method, dividing into a group of regions G1 to G4and a group of regions G5 to G8 as shown in FIG. 4 is conceivable.

In this case, the number of data connection channels intersected by theboundary 2 is two, the minimum number. However, the regions G5 to G8extend largely along the periphery of the circuit region 1. Therefore,if CTS is executed in the state shown in FIG. 4, the clock delay isincreased. An increase in clock delay leads to a reduction inon-chip-variation resistance. For this reason, dividing such asdescribed above is not preferable.

In this embodiment, therefore, a restriction is imposed on theabove-described grouping in the first embodiment such that an FF locatedat a distance larger than a certain distance from the centroid of aregion is not contained in the same region. That is, a restriction isgiven such that the positions of FFs contained in a region afterdividing into groups of regions are within a predetermined distance fromthe centroid of the region. A different restriction may alternatively begiven such that the distance between the remotest two FFs is equal to orsmaller than a certain value. If such a restriction is provided, anincrease in clock delay and, hence, a reduction in on-chip-variationresistance can be prevented.

The above-described grouping in the first embodiment is an example of anarrangement in which a boundary intersects a data connection channelhaving a larger interconnection distance (or a larger number of logicstages) with priority and an intergroup wiring line is thereby formed.However, if this data connection channel is a critical path without asufficient setup timing margin, there is a possibility of this pathbecoming an error path due to the influence of on-chip variation whenused as an intergroup wiring line. Therefore, a restriction may beimposed such that a path determined in advance as not having asufficient setup timing margin is not assigned as an intergroup wiringline. That is, a restriction is given such that a boundary for theabove-described grouping in the first embodiment does not intersect adata connection channel with a setup margin equal to or smaller than apredetermined value, thus effectively preventing the occurrence of anerror path due to on-chip variation.

In the first and second embodiments, a technique of taking a solution tominimize the number of intergroup connection wiring lines with thehighest priority at the time of grouping and determining the priorityaccording to a different factor if a plurality of the same solutionsexist has been described. However, even in a case where the priority isdetermined in a different way, a similar effect can also be obtained. Amethod of treating all factors as function values and determining themat a time by a weighting evaluation function is generally known well.Such a method can also be applied to the present invention.

In the first and second embodiments, clock forming methods have beendescribed in which CTS is performed after dividing a circuit region(grouping circuit regions). The same effects as the above-describedclock forming methods can also be obtained by preparing each method as aprogram product for executing the method by means of a piece ofprogram-controllable hardware (computer or the like) and by executingthe program.

Obviously many modifications and variations of the present invention arepossible in the light of the above teachings. It is therefore to beunderstood that within the scope of the appended claims the inventionmay by practiced otherwise than as specifically described.

The entire disclosure of a Japanese Patent Application No. 2005-309861,filed on Oct. 25, 2005 including specification, claims, drawings andsummary, on which the Convention priority of the present application isbased, are incorporated herein by reference in its entirety.

1. A clock forming method for a semiconductor integrated circuitcomprising the steps of: a first step of dividing a circuit region intoplural regions, each region having plural elements and connectionchannels for transferring data between the plurality of regions; and asecond step of synthesizing a clock tree by inserting clock drivers sothat the elements in each region are connected in tree form, wherein thenumber of connection channels intersected by a boundary is minimizedwhen the circuit region is divided, and wherein when the circuit regionis divided, the positions of the elements contained in each region afterdividing are within a predetermined distance from a centroid of theregion.
 2. The method according to claim 1, wherein when the circuitregion is divided, the boundary intersects the connection channelshaving a longer channel length or the connection channels having alarger number of logic stages with priority.
 3. A clock forming methodfor a semiconductor integrated circuit, the method comprising: a firststep of dividing a circuit region into plural regions, each regionhaving plural elements and connection channels for transferring databetween the plurality of regions; a second step of synthesizing a clocktree by inserting clock drivers so that the elements in each region areconnected in tree form; wherein the number of connection channelsintersected by a boundary is minimized when the circuit region isdivided, and wherein when the circuit region is divided, the boundarydoes not intersect the connection channels having a setup margin equalto or smaller than a predetermined value.
 4. A program product forcausing a computer to execute a clock forming for a semiconductorintegrated circuit: a first step of dividing a circuit region intoplural regions each region having plural elements and connectionchannels for transferring data between the regions; and a second step ofsynthesizing a clock tree by inserting clock drivers so that theelements in each region are connected in tree form, wherein the numberof the connection channels intersected by a boundary is minimized whenthe circuit region is divided, and wherein when the current region isdivided, the positions of the elements contained in each region afterdividing are within a predetermined distance from the centroid of theregion or the boundary does not intersect the connection channels havinga setup margin equal to or smaller than a predetermined value.
 5. Theprogram product according to claim 4, wherein when the circuit region isdivided, the boundary intersects the connection channels having a longerchannel length or the connection channels having a larger number oflogic stages with priority.